Name
Affiliation
Papers
DAGMAR PETERS-DROLSHAGEN
Univ Bremen, Inst Electrodynam & Microelect ITEM me, D-28359 Bremen, Germany
31
Collaborators
Citations 
PageRank 
45
39
12.87
Referers 
Referees 
References 
45
359
149
Search Limit
100359
Title
Citations
PageRank
Year
Parameter Extraction for a Simplified EKV-model in a 28nm FDSOI Technology00.342020
Charge-Based Model for Reliability Analysis Flow of Flip- Flops under Process Variation and Aging00.342019
A New Approach to Threshold Voltage Measurements of Transistors00.342018
ReSeMBleD-Methods for Response Surface Model Behavioral Description00.342018
Reliability-Aware Multi-Vth Domain Digital Design Assessment00.342018
Design for reliability of generic sensor interface circuits.00.342018
Multi-User Frame Synchronization in Wireless Networks with Sporadic User Activity00.342017
Implications for a Wireless, External Device System to Study Electrocorticography.10.632017
Variation- and degradation-aware stochastic behavioral modeling of analog circuit components30.542017
Design and Verification of Analog CMOS Circuits Using the g m/I D-Method with Age-Dependent Degradation Effects.00.342017
Behavioral modeling of a sensor interface circuit including various non-idealities20.502017
Parametrisable digital design of a sphere decoder with high-level synthesis.00.342017
Parameter identification for behavioral modeling of analog components including degradation40.572016
Activity and Channel Estimation in Multi-User Wireless Sensor Networks00.342016
Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits00.342016
Design And Verification Of Analog Cmos Circuits Using The Gm/I-D-Method With Age-Dependent Degradation Effects00.342016
Rapid digital architecture design of orthogonal matching pursuit.00.342016
Analysis of aging effects - From transistor to system level.10.432016
Reliability-aware design method for CMOS circuits.00.342016
Hardware-accelerated reconstruction of compressed neural signals based on inpainting00.342016
Fast digital design space exploration with high-level synthesis: A case study with approximate conjugate gradient pursuit00.342016
Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process20.402016
Variability-aware aging modeling for reliability analysis of an analog neural measurement system00.342015
Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity20.522015
NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits40.602015
Structure reconstruction of correlated neural signals based on inpainting for brain monitoring20.392015
An aging-aware transistor sizing tool regarding BTI and HCD degradation modes20.452015
Exploiting correlation in neural signals for data compression40.472014
Development of a fully implantable recording system for ECoG signals60.652013
Reliability analysis for integrated circuit amplifiers used in neural measurement systems20.482013
Joint compression of neural action potentials and local field potentials40.502013