Name
Abstract | ||
|---|---|---|
The increased complexity of, and heightened reliance on, modern electronic systems has raised the importance of the testing of these systems To new levels. The key to a successful testing strategy is the use of a structured testability methodology throughout the design life cycle. The automation of such a methodology is achieved through TESPAD, a PC-based, Windows 3.1 tool. TESPAD assists in the incorporation of a structured methodology by defining and allocating, at early stages of (and throughout) the design life cycle, detailed testability measures, recommended DFT/BIT methods and structures, data formats and data delivery, and validation/verification procedures. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1109/ICECS.1996.584605 | ICECS |
Keywords | DocType | Citations |
system testing,structural testing,structured data,sequential analysis,design methodology,life cycle,design for testability,combinational circuits | Conference | 0 |
PageRank | References | Authors |
0.34 | 3 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| wolfdietrich weber | 1 | 0 | 0.34 |
| m g mcnamer | 2 | 0 | 0.34 |
| Nick Kanopoulos | 3 | 34 | 12.44 |