Name
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/ISSCC.2006.1696272 | ISSCC |
Keywords | DocType | Citations |
automatic test equipment,cmos integrated circuits | Conference | 8 |
PageRank | References | Authors |
1.53 | 1 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Toshiyuki Okayasu | 1 | 19 | 5.92 |
| Masakatsu Suda | 2 | 15 | 4.36 |
| Kazuhide Yamamoto | 3 | 207 | 39.66 |
| Shusuke Kantake | 4 | 10 | 2.17 |
| Satoshi Sudou | 5 | 10 | 2.17 |
| Daisuke Watanabe | 6 | 14 | 4.42 |