Abstract | ||
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A novel dynamic element matching (DEM) method, called binary-tree random DEM (BTR-DEM), is presented for a Nyquist-rate current-steering digital-to-analog converter (DAC). By increasing or decreasing the number of unit current sources randomly at the same time, the BTR-DEM encoding reduces switch transition glitches. A 5-bit current-teering DAC with the BTR-DEM technique is implemented in a 65-nm CMOS technology. The measured spurious free dynamic range (SFDR) attains 42 dB for a sample rate of 100 MHz and shows little dependence on signal frequency. |
Year | DOI | Venue |
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2015 | 10.1587/transele.E98.C.1193 | IEICE TRANSACTIONS ON ELECTRONICS |
Keywords | DocType | Volume |
dynamic element matching (DEM), current-steering digital-to-analog converter (DAC), spurious free dynamic range (SFDR) | Journal | E98C |
Issue | ISSN | Citations |
12 | 1745-1353 | 0 |
PageRank | References | Authors |
0.34 | 6 | 4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Yuan Wang | 1 | 17 | 13.39 |
Wei Su | 2 | 2 | 0.76 |
Guangliang Guo | 3 | 0 | 0.68 |
zhang | 4 | 10 | 9.77 |