Title
Novel Dem Technique For Current-Steering Dac In 65-Nm Cmos Technology
Abstract
A novel dynamic element matching (DEM) method, called binary-tree random DEM (BTR-DEM), is presented for a Nyquist-rate current-steering digital-to-analog converter (DAC). By increasing or decreasing the number of unit current sources randomly at the same time, the BTR-DEM encoding reduces switch transition glitches. A 5-bit current-teering DAC with the BTR-DEM technique is implemented in a 65-nm CMOS technology. The measured spurious free dynamic range (SFDR) attains 42 dB for a sample rate of 100 MHz and shows little dependence on signal frequency.
Year
DOI
Venue
2015
10.1587/transele.E98.C.1193
IEICE TRANSACTIONS ON ELECTRONICS
Keywords
DocType
Volume
dynamic element matching (DEM), current-steering digital-to-analog converter (DAC), spurious free dynamic range (SFDR)
Journal
E98C
Issue
ISSN
Citations 
12
1745-1353
0
PageRank 
References 
Authors
0.34
6
4
Name
Order
Citations
PageRank
Yuan Wang11713.39
Wei Su220.76
Guangliang Guo300.68
zhang4109.77