Name
Title | ||
|---|---|---|
Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology. |
Year | Venue | DocType |
|---|---|---|
2015 | Microelectronics Reliability | Journal |
Volume | Issue | Citations |
55 | 9-10 | 0 |
PageRank | References | Authors |
0.34 | 9 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hao Cai | 1 | 60 | 21.94 |
| You Wang | 2 | 29 | 9.66 |
| Lirida A. B. Naviner | 3 | 83 | 26.52 |
| Weisheng Zhao | 4 | 730 | 105.43 |