Name
Title | ||
|---|---|---|
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC–DC converter |
Abstract | ||
|---|---|---|
Past works showed that the degradation of the passive components caused by aging could induce failures of electronic system, including a harmful evolution of electromagnetic compatibility. This paper presents the impact of the accelerated thermal aging on the electromagnetic emission (EME) of a buck DC-DC converter. The experimental analysis indicates that the aging degradation of several passive components (electrolytic capacitor and powder iron inductor) is the main source of EME evolution. Based on experimental measurement and physical analysis, the empirical degradation models of related passive devices are proposed. The overall objective of this study is to predict the electromagnetic emission evolution of a buck DC-DC converter under a thermal aging, by using these passive device degradation models. (C) 2015 Elsevier Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1016/j.microrel.2015.06.058 | MICROELECTRONICS RELIABILITY |
Keywords | Field | DocType |
Counterfeit detection,Electromagnetic emission,Integrated circuit | Electrolytic capacitor,Inductor,Electronic engineering,Degradation (geology),Electromagnetic compatibility,Engineering,Electromagnetic emission,Electronic component,Dc dc converter,Integrated circuit | Journal |
Volume | Issue | ISSN |
55 | 9-10 | 0026-2714 |
Citations | PageRank | References |
1 | 0.37 | 1 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| He Huang | 1 | 1 | 0.37 |
| Alexandre Boyer | 2 | 19 | 6.90 |
| Sonia Ben Dhia | 3 | 6 | 2.04 |