Title
Optimum Operating Points of Transistors with minimal Aging-Aware Sensitivity
Abstract
Degradation of the threshold voltage in CMOS transistors affects the performance of analog circuits over time. In order to meet set target specifications, the influence of these degradation modes needs to be considered and compensated during the design phase. This work introduces an aging-aware sensitivity function, which allows the computation of optimum operating points of transistors, revealing circuits with a minimum degradation with respect to aging. A PMOS common source amplifier is designed by setting operating points of all relevant transistors according to the minimal sensitivity with respect to aging. The results show that for given target specification this method provides a well functional measure to reduce the degradation of circuit characteristics.
Year
DOI
Venue
2015
10.1145/2800986.2801021
SBCCI
Keywords
Field
DocType
Reliability, Degradation, Aging-Aware, Sensitivity, BTI, HCD, Analog
Common source,Analogue electronics,Computer science,CMOS,Electronic engineering,PMOS logic,Transistor,Sensitivity (control systems),Electronic circuit,Electrical engineering,Integrated circuit
Conference
Citations 
PageRank 
References 
2
0.52
5
Authors
4
Name
Order
Citations
PageRank
Nico Hellwege1114.18
Nils Heidmann2143.89
Steffen Paul314240.96
Dagmar Peters-Drolshagen43912.87