Title
Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors
Year
DOI
Venue
2015
10.1109/ISVLSI.2015.42
IEEE Computer Society Annual Symposium on VLSI
Field
DocType
ISSN
System on a chip,Rf circuit,RF probe,Radio frequency,Electronic engineering,Engineering,Electronic circuit,Very-large-scale integration,Electrical engineering,Calibration
Conference
2159-3469
Citations 
PageRank 
References 
0
0.34
3
Authors
6
Name
Order
Citations
PageRank
Athanasios Dimakos111.04
Martin Andraud2266.96
Louay Abdallah3505.78
Haralampos-G. D. Stratigopoulos425228.06
Emmanuel Simeu59016.55
Salvador Mir642656.22