Title
Emulation-based selection and assessment of assertion checkers for post-silicon validation
Abstract
The objective of post-silicon validation is to detect design errors on early silicon prototypes. Electrically-induced errors commonly manifest as bit-flips in the logic domain and they occur under unique operating conditions, which are often not-easily-repeatable. In order to shorten the long detection latencies from an error's manifestation until its observation (i.e. system crash), embedded assertion checkers can be employed. Nonetheless, relying on simulation-based experiments for selecting and assessing the usefulness of a subset of assertion checkers (to be committed to silicon) suffers from limitations associated with the slow simulation speed. To address this concern, in this paper we present a systematic method to automatically design emulation-based experiments that can aid the selection and assessment of the embedded assertion checkers. Our results indicate improvements of up to 10% on average for the coverage of flip-flops that are affected by bit-flips when compared to results obtained from simulation-based experiments.
Year
DOI
Venue
2015
10.1109/ICCD.2015.7357083
International Conference on Computer Design
Keywords
Field
DocType
electrically-induced errors,logic domain,bit-flips,design error detection,post-silicon validation,embedded assertion checker assessment,emulation-based selection,Si
Crash,Post-silicon validation,Computer science,Assertion,Real-time computing,Emulation,Hardware emulation
Conference
Citations 
PageRank 
References 
2
0.37
15
Authors
2
Name
Order
Citations
PageRank
Pouya Taatizadeh1112.26
Nicola Nicolici280759.91