Title | ||
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Emulation-based selection and assessment of assertion checkers for post-silicon validation |
Abstract | ||
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The objective of post-silicon validation is to detect design errors on early silicon prototypes. Electrically-induced errors commonly manifest as bit-flips in the logic domain and they occur under unique operating conditions, which are often not-easily-repeatable. In order to shorten the long detection latencies from an error's manifestation until its observation (i.e. system crash), embedded assertion checkers can be employed. Nonetheless, relying on simulation-based experiments for selecting and assessing the usefulness of a subset of assertion checkers (to be committed to silicon) suffers from limitations associated with the slow simulation speed. To address this concern, in this paper we present a systematic method to automatically design emulation-based experiments that can aid the selection and assessment of the embedded assertion checkers. Our results indicate improvements of up to 10% on average for the coverage of flip-flops that are affected by bit-flips when compared to results obtained from simulation-based experiments. |
Year | DOI | Venue |
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2015 | 10.1109/ICCD.2015.7357083 | International Conference on Computer Design |
Keywords | Field | DocType |
electrically-induced errors,logic domain,bit-flips,design error detection,post-silicon validation,embedded assertion checker assessment,emulation-based selection,Si | Crash,Post-silicon validation,Computer science,Assertion,Real-time computing,Emulation,Hardware emulation | Conference |
Citations | PageRank | References |
2 | 0.37 | 15 |
Authors | ||
2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Pouya Taatizadeh | 1 | 11 | 2.26 |
Nicola Nicolici | 2 | 807 | 59.91 |