Name
Title | ||
|---|---|---|
Simple And Accurate Single Event Charge Collection Macro Modeling For Circuit Simulation |
Abstract | ||
|---|---|---|
A simple macro-model to accurately simulate upset error on CMOS devices is presented. This macro-model can accurately simulate the typical behavior of single event effect (SEE) caused by ionizing radiation charge collection at N type and P type diffusions. The model is calibrated using 3-D mixed mode technology computer aided design (TCAD) device simulations and implemented as a SPICE circuit macro-model. The model uses a dependent current source with a Weibull distribution to model the current injection on circuit node. The model shows physical response and adjusting parameters allows high accuracy to the 3-D TCAD simulated response. |
Year | Venue | Keywords |
|---|---|---|
2015 | 2015 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | SPICE, Ionizing particle, Single Event Effects, TCAD, 3D simulation |
Field | DocType | ISSN |
Spice,Computer science,Dependent source,Weibull distribution,CMOS,Electronic engineering,Upset,Solid modeling,Macro,Technology CAD | Conference | 0271-4302 |
Citations | PageRank | References |
1 | 0.63 | 0 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Aymeric Privat | 1 | 1 | 0.63 |
| Lawrence T. Clark | 2 | 155 | 33.27 |