Name
Title | ||
|---|---|---|
Improved sequential ATPG using functional observation information and new justification methods |
Abstract | ||
|---|---|---|
Sequential ATPG (Automatic Test Pattern Generation) is a very desirable CAD tool, but to date, the site and complexity of circuits for which sequential ATPG could be performed has been limited. We have discovered a method for collecting functional information which makes fault observation significantly easier. We also propose a new method for state justification which is a combination of function-based methods and structure-based methods. Our sequential ATPG system deals with circuits without a reset state or a synchronizing sequence, and the experimental results show that the proposed method achieves significant improvements over existing sequential ATPG methods. |
Year | DOI | Venue |
|---|---|---|
1995 | 10.1109/EDTC.1995.470386 | ED&TC |
Field | DocType | ISSN |
Cad tools,Automatic test pattern generation,Sequential logic,Logic testing,Computer science,Synchronizing,Automatic testing,Electronic engineering,Electronic circuit,Very-large-scale integration | Conference | 1066-1409 |
ISBN | Citations | PageRank |
0-8186-7039-8 | 8 | 0.90 |
References | Authors | |
10 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jaehong Park | 1 | 919 | 87.01 |
| Chanhee Oh | 2 | 353 | 43.20 |
| M. R. Mercer | 3 | 353 | 47.36 |