Name
Abstract | ||
|---|---|---|
In this paper a novel accumulator-based Built-In Self Test (BIST) method for complete two-pattern test generation is presented. Complete two-pattern testing has been proposed for stuck-open and delay testing. The proposed scheme is very attractive for a wide range of circuits based on data-path architectures with arithmetic units, or with accumulators containing binary adders. Our method generates all 2/sup n/(2/sup n/-1) distinct two-pattern pairs for a n-input circuit under test within 2/sup n/(2/sup n/-1) clock cycles. The proposed method can be easily modified to generate complete two-pattern tests for circuits having k, (kn) inputs, within 2/sup k/(2/sup k/-1) clock cycles. Thus, this method is well-suited for circuits consisting of several modules with different number of inputs. |
Year | DOI | Venue |
|---|---|---|
1995 | 10.1109/EDTC.1995.470360 | ED&TC |
Field | DocType | ISSN |
Shift register,Adder,Computer science,System testing,Electronic engineering,Real-time computing,Electronic circuit,Accumulator (structured product),Hydraulic accumulator,Binary number,Built-in self-test | Conference | 1066-1409 |
ISBN | Citations | PageRank |
0-8186-7039-8 | 13 | 1.13 |
References | Authors | |
5 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| I. Voyiatzis | 1 | 39 | 9.33 |
| A. Paschalis | 2 | 358 | 31.08 |
| D. Nikolos | 3 | 291 | 31.38 |
| Constantin Halatsis | 4 | 33 | 3.15 |