Title | ||
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15.4 A 280µW 24kHz-BW 98.5dB-SNDR chopped single-bit CT ΔΣM achieving <10Hz 1/f noise corner without chopping artifacts. |
Abstract | ||
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Many industrial applications require high-resolution ADCs whose low-frequency performance is important. CTDSMs are attractive due to their implicit antialiasing and resistive inputs. However, their low-frequency precision is degraded by flicker noise. The loop filter of such modulators is usually realized using active-RC techniques, and the CTDSMsu0027 1/f noise is mostly due to the input stage of the 1st OTA. Using large input devices to reduce 1/f noise greatly increases area occupied by the input stage, and degrades linearity due to the increased parasitic capacitance at the OTA virtual ground. |
Year | Venue | Field |
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2016 | ISSCC | Flicker noise,Computer science,Noise (electronics),Phase noise,Electronic engineering,Noise temperature,Noise spectral density,Effective input noise temperature,Noise generator,Noise (radio),Electrical engineering |
DocType | Citations | PageRank |
Conference | 1 | 0.40 |
References | Authors | |
2 | 3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Sujith Billa | 1 | 1 | 0.40 |
Amrith Sukumaran | 2 | 20 | 3.58 |
Shanthi Pavan | 3 | 391 | 87.81 |