Title
Enabling inter-die co-optimization in 3-D IC with TSVs
Abstract
Even though three-dimensional integrated circuits (3-D ICs) with through silicon vias (TSVs) potentially provide modern electronic devices with various advantages, current commercial tools do not realize their layout as a whole, but one by one in a stack of dies. The capability of inter-die co-optimization remains largely restricted. This is, in part, due to that the tools draw heavily on 2-D IC's design and implementation styles. Inter-die co-optimization is imperative for 3-D ICs where timing, power, and area are simultaneously considered. In this paper, we show how to enable inter-die co-optimization with adaptive buffering. Empirical results indicate that the proposed scheme eliminates iterative routines, which can help hasten the pace of realizing 3-D integration.
Year
DOI
Venue
2013
10.1109/VLDI-DAT.2013.6533885
VLSI-DAT
Keywords
Field
DocType
electronic design automation (EDA), inter-die co-optimization, three-dimensional integrated circuit (3-D IC), through-silicon via (TSV)
Integrated circuit layout,Computer science,IC layout editor,Electronic engineering,Electronics,Integrated circuit design,Electronic design automation,Three-dimensional integrated circuit,Physical design,Integrated circuit,Embedded system
Conference
ISSN
ISBN
Citations 
2474-2724
978-1-4673-4435-7
0
PageRank 
References 
Authors
0.34
8
5
Name
Order
Citations
PageRank
Chang-Tzu Lin1447.43
Tsu-Wei Tseng21439.34
Yung-Fa Chou324423.76
Chia-Hsin Lee4245.29
Ding-Ming Kwai552146.85