Title
Laser-Induced Fault Effects In Security-Dedicated Circuits
Abstract
Lasers have become one of the most efficient means to attack secure integrated systems. Actual faults or errors induced in the system depend on many parameters, including the circuit technology and the laser characteristics. Understanding the physical effects is mandatory to correctly evaluate during the design flow the potential consequences of a laser-based attack and implement efficient counter-measures. This paper presents results obtained within the LIESSE project, aiming at defining a comprehensive approach for designers. Outcomes include the definition of fault/error models at several levels of abstraction, specific CAD tools using these models and new counter-measures well-suited to thwart laser-based attacks. Actual measures on components manufactured in the new 28 nm FDSOI technology are also presented.
Year
DOI
Venue
2014
10.1007/978-3-319-25279-7_12
VLSI-SOC: INTERNET OF THINGS FOUNDATIONS
Keywords
DocType
Volume
Hardware security, Fault attacks, Lasers, Fault models, Security evaluation, Counter-measures
Conference
464
ISSN
Citations 
PageRank 
1868-4238
3
0.53
References 
Authors
12
15