Name
Abstract | ||
|---|---|---|
This paper presents a digital testing strategy for characterizing an analog circuit block. The operational amplifier (op amp) is evaluated due to its wide application in electronic circuits and systems. In the proposed strategy, the op amp device under test (DUT) is configured to respond to a testing pulse, and the associated output is digitized by a digital buffer to reduce the high cost of gener... |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1109/TIM.2016.2534298 | IEEE Transactions on Instrumentation and Measurement |
Keywords | Field | DocType |
Testing,Operational amplifiers,Analog circuits,Hardware,Circuit faults,Radiation detectors,Clocks | Analogue electronics,Device under test,Electronic engineering,Op amp integrator,Electronic circuit,Slew rate,Test strategy,Operational amplifier,Mathematics | Journal |
Volume | Issue | ISSN |
65 | 6 | 0018-9456 |
Citations | PageRank | References |
0 | 0.34 | 20 |
Authors | ||
1 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hsin-Wen Ting | 1 | 41 | 8.81 |