Name
Title | ||
|---|---|---|
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC. |
Year | Venue | DocType |
|---|---|---|
2016 | IEEE Trans. on Circuits and Systems | Journal |
Volume | Issue | Citations |
63-I | 11 | 0 |
PageRank | References | Authors |
0.34 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Manuel J. Barragan | 1 | 29 | 10.01 |
| Rshdee Alhakim | 2 | 11 | 2.90 |
| Haralampos-G. D. Stratigopoulos | 3 | 252 | 28.06 |
| Matthieu Dubois | 4 | 0 | 1.01 |
| Salvador Mir | 5 | 426 | 56.22 |
| Herve Le Gall | 6 | 12 | 2.51 |
| Neha Bhargava | 7 | 0 | 2.03 |
| Ankur Bal | 8 | 0 | 0.34 |