Title
Fault-Tolerant FPGA with Column-Based Redundancy and Power Gating Using RRAM.
Abstract
This paper presents a silicon-proven fault tolerant FPGA architecture that can repair a wide range of hardware faults. The proposed architecture does not require fine-grained fault location, and the error map is stored in non-volatile resistive memory that is monolithically integrated on top of the CMOS circuit. Redundancy operations are fully self-contained and do not affect data streaming in and out of the FPGA. The power gating scheme is implemented to save idle leakage power and fix hardware faults in the power network. Significant yield enhancement is expected using this architecture. The architecture has been verified in a test chip fabricated in 28nm technology. Redundancy operation is solely controlled by on chip fault locators which are HfO2-based resistive memories monolithically integrated after CMOS process. The maximum shift in performance is about 2 percent when the redundancy is engaged, and the power footprint is unaffected.
Year
DOI
Venue
2017
10.1109/TC.2016.2634533
IEEE Trans. Computers
Keywords
DocType
Volume
Field programmable gate arrays,Circuit faults,Fault tolerant systems,Maintenance engineering,CMOS integrated circuits,Streaming media,Reconfigurable logic
Journal
66
Issue
ISSN
Citations 
6
0018-9340
0
PageRank 
References 
Authors
0.34
22
2
Name
Order
Citations
PageRank
Kibum Lee100.34
S. Simon Wong233240.81