Name
Abstract | ||
|---|---|---|
This work proposes a new method for measuring the performance loss of a processor due to aging (BTI and HCI). It is designed for any adaptive system incorporating in-situ delay monitors and local temperature sensors. To validate it, we developed a simplified circuit-level model for BTI/HCI effects in 28nm FD-SOI technology with a relative small error (<;1%). The correct operation of the proposed method has been verified in MATLAB/Simulink environment. It is shown that one can measure the circuit aging over a wide range of temperatures, the circuit aging being determined by the reduction of the maximum clock frequency. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1109/NEWCAS.2016.7604809 | 2016 14th IEEE International New Circuits and Systems Conference (NEWCAS) |
Keywords | Field | DocType |
HCI effects,BTI effects,adaptive systems,performance loss,in-situ delay monitors,local temperature sensors,simplified circuit-level model,FD-SOI technology,MATLAB-Simulink environment,circuit aging,maximum clock frequency reduction,bias temperature instability,hot carrier injection | MATLAB,Computer science,Adaptive system,Electronic engineering,Temperature measurement,Clock rate | Conference |
ISSN | ISBN | Citations |
2472-467X | 978-1-4673-8901-3 | 0 |
PageRank | References | Authors |
0.34 | 4 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Mauricio Altieri | 1 | 3 | 1.80 |
| Suzanne Lesecq | 2 | 111 | 20.60 |
| Edith Beigne | 3 | 536 | 52.54 |
| Olivier Héron | 4 | 52 | 8.47 |
| Diego Puschini | 5 | 71 | 10.76 |