Paper Info
Title
A New Approach To Feature-Based Test Suite Reduction In Software Product Line Testing
Abstract
In many cases, Software Product Line Testing (SPLT) targets only the selection of test cases which cover product features or feature interactions. However, higher testing efficiency can be achieved through the selection of test cases with improved fault-revealing capabilities. By associating each test case a priority-value representing (or aggregating) distinct criteria, such as importance (in terms of fault discovered in previous test campaigns), duration or cost, it becomes possible to select a feature-covering test suite with improved capabilities. A crucial objective in SPLT then becomes to identify a test suite that optimizes reaching a specific goal (lower test duration or cost), while preserving full feature coverage. In this paper, we revisit this problem with a new approach based on constraint optimization with a special constraint called GLOBAL CARDINALITY and a sophisticated search heuristic. This constraint enforces the coverage of all features through the computation of max flows in a network flow representing the coverage relation. The computed max flows represent possible solutions which are further processed in order to determine the solution that optimizes the given objective function, e.g., the lowest test execution costs. Our approach was implemented in a tool called Flower/C and experimentally evaluated on both randomly generated instances and industrial case instances. Comparing Flower/C with MINTS (Minimizer for Test Suites), the State-Of-the-Art tool based on an integer linear formulation for performing similar test suite optimization, we show that our approach either outperforms MINTS or has comparable performance on random instances. On industrial instances, we compared three distinct models of Flower/C (using distinct global constraints) and the one mixing distinct constraints showed excellent performances with high reduction rates. These results opens door to an industrial adoption of the proposed technology.
Year
DOI
Venue
2016
10.5220/0005983400480058
ICSOFT-EA: PROCEEDINGS OF THE 11TH INTERNATIONAL JOINT CONFERENCE ON SOFTWARE TECHNOLOGIES - VOL. 1
Keywords
Field
DocType
Test Suite Reduction, Software Product Line Testing
Test suite,Systems engineering,Test Management Approach,Computer science,Regression testing,Model-based testing,Software product line,Feature based,Software construction,Reliability engineering,Keyword-driven testing
Conference
Citations 
PageRank 
References 
0
0.34
0
Authors
4
Name
Order
Citations
PageRank
Arnaud Gotlieb183363.83
Mats Carlsson297579.24
Dusica Marijan316216.31
Alexandre Petillon400.34