Name
Title | ||
|---|---|---|
Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax. |
Abstract | ||
|---|---|---|
In previous literatures, many approaches use ring oscillators or other process monitors to correlate the chip's maximum operating frequency (Fmax). But none of them focus on the placement of these on-chip process monitors (OPMs) on a chip. The placement will greatly influence the accuracy of a prediction model. In this paper, we first propose a simulation framework to sample a chip's Fmax and it's OPM result. These samples are used to develop our methodology of OPM placement and to verify the effectiveness of an OPM placement. Then, a model-fitting framework is presented to correlate the OPMs' result to chip's Fmax. Finally, we propose a methodology to idenify optimal placement of OPM for predicting Fmax. The experiments demonstrate the effectiveness of our methodology in both simulation and silicon data. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1145/2966986.2967076 | ICCAD |
Field | DocType | ISSN |
System on a chip,Operating frequency,Computer science,Chip,Electronic engineering,Real-time computing | Conference | 1933-7760 |
Citations | PageRank | References |
0 | 0.34 | 14 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Szu-Pang Mu | 1 | 12 | 2.00 |
| Wen-Hsiang Chang | 2 | 3 | 1.45 |
| Mango C.-T. Chao | 3 | 48 | 7.38 |
| Yiming Wang | 4 | 109 | 28.42 |
| Ming-Tung Chang | 5 | 12 | 2.59 |
| Min-Hsiu Tsai | 6 | 7 | 1.65 |