Title
Parameter identification for behavioral modeling of analog components including degradation
Abstract
An analog system's performance can be influenced by many factors such as age-dependent degradation effects which need to be considered during the design process. Transistor level degradation analysis is very time-consuming for large and complex circuits. Behavioral models can be used to speed up the simulation and enable an evaluation on a higher abstraction level. In this paper, a structured method for the development of behavioral models is proposed. By using Response Surface Models to represent a system's key-performances, reliability analysis on system level is possible. A sensitivity analysis is used to identify the relevant parameters and to reduce the overall complexity of the model. The method is demonstrated on an amplifier and a voltage reference.
Year
DOI
Venue
2016
10.1109/MIXDES.2016.7529759
2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems
Keywords
Field
DocType
behavioral modeling,RSM,reliability,sensitivity
Computer science,Semiconductor device modeling,Voltage reference,Behavioral modeling,Electronic engineering,Control engineering,Engineering design process,Abstraction layer,Electronic circuit,Reliability engineering,Amplifier,Speedup
Conference
ISBN
Citations 
PageRank 
978-1-5090-3099-6
4
0.57
References 
Authors
5
5
Name
Order
Citations
PageRank
maike taddiken1174.12
Theodor Hillebrand2113.02
Konstantin Tscherkaschin341.58
Steffen Paul414240.96
Dagmar Peters-Drolshagen53912.87