Title | ||
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Parameter identification for behavioral modeling of analog components including degradation |
Abstract | ||
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An analog system's performance can be influenced by many factors such as age-dependent degradation effects which need to be considered during the design process. Transistor level degradation analysis is very time-consuming for large and complex circuits. Behavioral models can be used to speed up the simulation and enable an evaluation on a higher abstraction level. In this paper, a structured method for the development of behavioral models is proposed. By using Response Surface Models to represent a system's key-performances, reliability analysis on system level is possible. A sensitivity analysis is used to identify the relevant parameters and to reduce the overall complexity of the model. The method is demonstrated on an amplifier and a voltage reference. |
Year | DOI | Venue |
---|---|---|
2016 | 10.1109/MIXDES.2016.7529759 | 2016 MIXDES - 23rd International Conference Mixed Design of Integrated Circuits and Systems |
Keywords | Field | DocType |
behavioral modeling,RSM,reliability,sensitivity | Computer science,Semiconductor device modeling,Voltage reference,Behavioral modeling,Electronic engineering,Control engineering,Engineering design process,Abstraction layer,Electronic circuit,Reliability engineering,Amplifier,Speedup | Conference |
ISBN | Citations | PageRank |
978-1-5090-3099-6 | 4 | 0.57 |
References | Authors | |
5 | 5 |
Name | Order | Citations | PageRank |
---|---|---|---|
maike taddiken | 1 | 17 | 4.12 |
Theodor Hillebrand | 2 | 11 | 3.02 |
Konstantin Tscherkaschin | 3 | 4 | 1.58 |
Steffen Paul | 4 | 142 | 40.96 |
Dagmar Peters-Drolshagen | 5 | 39 | 12.87 |