Name
Abstract | ||
|---|---|---|
It is getting mandatory to comply with ISO26262 in the recent automotive development. The implementation of safety mechanism to detect faults is one of the keys in ISO26262. The fault prediction will make the automotive system more reliable. The SoC in this paper introduces two features: hardware built-in self-test (BIST) for safety mechanism supporting automotive safety integrity level (ASIL) B a... |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/JSSC.2016.2623682 | IEEE Journal of Solid-State Circuits |
Keywords | Field | DocType |
Circuit faults,Built-in self-test,Hardware,Safety,Standards,Monitoring,Time factors | Interrupt,Computer science,Slicing,Voltage,Response time,Electronic engineering,Automotive Safety Integrity Level,Embedded system,Automotive industry,Voltage droop,Built-in self-test | Journal |
Volume | Issue | ISSN |
52 | 1 | 0018-9200 |
Citations | PageRank | References |
1 | 0.48 | 0 |
Authors | ||
8 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Shinichi Shibahara | 1 | 23 | 3.52 |
| Chikafumi Takahashi | 2 | 8 | 1.22 |
| Kazuki Fukuoka | 3 | 19 | 3.75 |
| Yuko Kitaji | 4 | 8 | 1.22 |
| Takahiro Irita | 5 | 66 | 14.07 |
| Hirotaka Hara | 6 | 8 | 1.22 |
| Yasuhisa Shimazaki | 7 | 94 | 20.16 |
| Jun Matsushima | 8 | 13 | 4.09 |