Ff-Control Point Insertion (Ff-Cpi) To Overcome The Degradation Of Fault Detection Under Multi-Cycle Test For Post | 0 | 0.34 | 2020 |
Automotive Functional Safety Assurance by POST with Sequential Observation. | 1 | 0.38 | 2018 |
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST | 0 | 0.34 | 2018 |
A 16 nm FinFET Heterogeneous Nona-Core SoC Supporting ISO26262 ASIL B Standard | 1 | 0.48 | 2017 |
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test | 1 | 0.39 | 2017 |
4.5 A 16nm FinFET heterogeneous nona-core SoC complying with ISO26262 ASIL-B: Achieving 10???7 random hardware failures per hour reliability | 7 | 0.74 | 2016 |
Multi-configuration Scan Structure for Various Purposes | 1 | 0.38 | 2016 |
An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms | 0 | 0.34 | 2012 |
A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule | 2 | 0.37 | 2012 |
CooLBIST: An Effective Approach of Test Power Reduction for LBIST | 0 | 0.34 | 2008 |