Name
Title | ||
|---|---|---|
Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation |
Abstract | ||
|---|---|---|
BIST based field testing is a promising way to guarantee the functional safety of intelligent and autonomous systems. To improve the fault coverage with less random patterns for BIST, sequentially observing some flip-flops (FFs) during multi-cycle test is useful. In this paper, we propose the methodology for selecting the Fault-Detection-Strengthened FFs in multi-cycle test by evaluating the structure of a circuit. The experimental results of ITC99 benchmarks and a real Electronic Control Unit (ECU) circuit show the effectiveness of the proposed methods in fault coverage improvement and random pattern reduction. |
Year | DOI | Venue |
|---|---|---|
2016 | 10.1109/ATS.2016.40 | 2016 IEEE 25th Asian Test Symposium (ATS) |
Keywords | Field | DocType |
BIST,multi-cycle test,fault vanishing,sequential observation,FF selection | Automatic test pattern generation,Logic gate,Fault coverage,Functional safety,Fault detection and isolation,Computer science,Electronic engineering,Real-time computing,Electronic control unit,Reliability engineering,Benchmark (computing),Built-in self-test | Conference |
ISSN | ISBN | Citations |
1081-7735 | 978-1-5090-3810-7 | 2 |
PageRank | References | Authors |
0.41 | 2 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Senling Wang | 1 | 18 | 5.91 |
| Hanan T. Al-Awadhi | 2 | 2 | 0.41 |
| Soh Hamada | 3 | 2 | 0.41 |
| Yoshinobu Higami | 4 | 140 | 27.24 |
| H. Takahashi | 5 | 18 | 3.94 |
| Hiroyuki Iwata | 6 | 3 | 0.79 |
| Jun Matsushima | 7 | 2 | 0.41 |