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Test Technology TC Newsletter.
Paper Info
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Title
Test Technology TC Newsletter.
Year
DOI
Venue
2006
10.1109/MDT.2006.107
IEEE Design & Test of Computers
DocType
Volume
Issue
Journal
23
4
Citations
PageRank
References
0
0.34
0
Authors
1
Authors (1 rows)
Cited by (0 rows)
References (0 rows)
Name
Order
Citations
PageRank
Bruce C. Kim
1
89
21.11
1
