Title
SiGe HBT Technology: Future Trends and TCAD-Based Roadmap.
Abstract
A technology roadmap for the electrical performance of high-speed silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) is presented based on combining the results of various 1-D, 2-D, and 3-D technology computer-aided design (TCAD) simulation tools with geometry scalable compact modeling. The latter, including all known parasitic effects, enables the accurate determination of the fig...
Year
DOI
Venue
2017
10.1109/JPROC.2015.2500024
Proceedings of the IEEE
Keywords
DocType
Volume
Heterojunction bipolar transistors,Silicon germanium,Integrated circuit modeling,BiCMOS integrated circuits,Performance evaluation,CMOS integrated circuits,Market research,Radio frequency,Terahertz materials,Electronics,CAD CAM
Journal
105
Issue
ISSN
Citations 
6
0018-9219
1
PageRank 
References 
Authors
0.48
0
8