Name
Abstract | ||
|---|---|---|
This paper presents a transient Pulse Dually Filterable and online Self-Recoverable (referred to as PDFSR) latch. Based on soft error masking property of C-element and using built-in delayed paths combined with a Schmitt inverter, a single event transient (SET) pulse could be dually filtered. Meanwhile, mutually feeding back mechanism of multiple C-elements was constructed to retain data, which makes the latch self-recoverable from a single event upset (SEU). Simulation results have demonstrated the SET filtering ability and SEU resilience at the cost of only 2.0% area-power-delay-width product increase on average, compared with the similar latches. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1587/elex.13.20160911 | IEICE ELECTRONICS EXPRESS |
Keywords | Field | DocType |
single event transient, single event upset, latch design | Computer science,Electronic engineering,Pulse (signal processing),Single event upset | Journal |
Volume | Issue | ISSN |
14 | 2 | 1349-2543 |
Citations | PageRank | References |
2 | 0.47 | 6 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Aibin Yan | 1 | 29 | 6.78 |
| Huaguo Liang | 2 | 216 | 33.27 |
| Yingchun Lu | 3 | 3 | 1.20 |
| Zhengfeng Huang | 4 | 84 | 30.14 |