Name
Abstract | ||
|---|---|---|
This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for circuits in which a large number of digital IC pins is multiplexed for scan. The basic concept of E-RPCT is to provide access to the internal scan chains via an IEEE 1149.1 compatible boundary-scan architecture, instead of direct access via the IC pins. The boundary-scan chain performs serial/parallel conversion of test data. E-RPCT also provides EO wrap to test non-contacted pins. The paper presents E-RPCT for full-scan design, as well as for full-scan core-based design. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/TEST.2001.966695 | INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS |
DocType | ISSN | Citations |
Conference | 1089-3539 | 1 |
PageRank | References | Authors |
0.36 | 0 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Harald P. E. Vranken | 1 | 1 | 0.36 |
| Tom Waayers | 2 | 128 | 11.47 |
| Hérvé Fleury | 3 | 1 | 0.36 |
| David Lelouvier | 4 | 1 | 0.36 |