Name
Abstract | ||
|---|---|---|
This work provides a detailed set of predictive data about FinFET and Trigate devices behavior considering process variability effects in ON and OFF currents. These evaluations help to understand the impact of variability sources identifying relevant behavior standards with respect to the use of FinFET and Trigate devices. The I-OFF suffers the higher impact of geometric variability, mainly on FinFET devices. PFET devices and the LSTP model are also more sensitive than NFET devices and high performance models. Results highlights that Trigate devices are up to 10% less sensitive to gate length variations. |
Year | Venue | Keywords |
|---|---|---|
2017 | 2017 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | Nanotechnology, Electrical characteristics, Multigate devices, Physical variability, Microelectronics |
Field | DocType | ISSN |
Logic gate,Computer science,Electronic engineering,Robustness (computer science),Process variability,Reliability engineering | Conference | 0271-4302 |
Citations | PageRank | References |
0 | 0.34 | 4 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Alexandra L. Zimpeck | 1 | 17 | 5.95 |
| Ygor Aguiar | 2 | 0 | 0.34 |
| Cristina Meinhardt | 3 | 21 | 13.35 |
| Ricardo A. L. Reis | 4 | 217 | 48.75 |