Abstract | ||
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The failure probability in SSDs increases when the number of Program/Erase (P/E) cycles increases. Traditionally, a group of SSDs are protected with parity disks, called SSD-based RAID. It has been shown that the reliability of RAIDs depends on the distribution of parities among SSDs. There are two main policies to distribute parities among SSDs in RAIDs, i.e., evenly and unevenly. By distributing... |
Year | DOI | Venue |
---|---|---|
2017 | 10.1109/TMSCS.2016.2598746 | IEEE Transactions on Multi-Scale Computing Systems |
Keywords | DocType | Volume |
Reliability,Arrays,Bit error rate,Measurement,Computational modeling,Solids,Power demand | Journal | 3 |
Issue | ISSN | Citations |
3 | 2332-7766 | 0 |
PageRank | References | Authors |
0.34 | 0 | 2 |
Name | Order | Citations | PageRank |
---|---|---|---|
Saeideh Alinezhad Chamazcoti | 1 | 6 | 1.80 |
Seyed Ghassem Miremadi | 2 | 531 | 50.32 |