Title
Automated flow for test pattern creation for IPs in SoC.
Abstract
With the increasing technological complexity modern SoC designs continue to grow in size and involve increasingly more IPs. Therefore, it becomes much harder to complete testing of large SoCs within the desired schedule and cost. Usually an automated hierarchical test helps to solve this problem efficiently but for such systems the preparation of input data, especially IP level information and description of test patterns, usually takes very long time. In this paper, an efficient solution for preparing input data for hierarchical system is presented.
Year
Venue
Field
2017
East-West Design & Test Symposium
Hierarchical control system,Multiprotocol Label Switching,Computer science,Flow (psychology),Server,Theoretical computer science,Computer hardware,Hierarchical test,Distributed computing
DocType
ISSN
Citations 
Conference
2373-826X
0
PageRank 
References 
Authors
0.34
3
4
Name
Order
Citations
PageRank
D. Sargsyan100.68
Gurgen Harutyunyan2197.30
Samvel K. Shoukourian316516.88
Yervant Zorian41994215.23