Name
Title | ||
|---|---|---|
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test |
Abstract | ||
|---|---|---|
ISO 26262 sets requirements for automotive safety systems to decrease hazards caused by LSI logic failures. Several approaches are possible to determine that a logical fault exists and for the system to respond before it becomes a system failure. However, these approaches are often expensive in terms of logic and design overhead. They can take many cycles before a high percentage of potential fault sites are checked. This paper presents a deterministic ATPG-based approach to detect faults during runtime operation. The benefit is lower area and less design impact compared to logic BIST while providing high coverage quickly and low power operation. We describe the implementation of deterministic ATPG-based runtime test (DART) based on embedded compression technology implemented in ICs for the R-Car autonomous vehicle platform. |
Year | DOI | Venue |
|---|---|---|
2017 | 10.1109/ATS.2017.52 | 2017 IEEE 26th Asian Test Symposium (ATS) |
Keywords | Field | DocType |
Automotive IC,ISO 26262,functional safety,on-line test,deterministic ATPG | Automatic test pattern generation,Iso standards,Automotive safety,Computer science,Real-time computing,Software,Integrated circuit,Reliability engineering,Built-in self-test,Automotive industry | Conference |
ISSN | ISBN | Citations |
1081-7735 | 978-1-5386-3516-2 | 1 |
PageRank | References | Authors |
0.39 | 4 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yoichi Maeda | 1 | 13 | 5.96 |
| Jun Matsushima | 2 | 13 | 4.09 |
| Ron Press | 3 | 113 | 9.12 |