Name
Title | ||
|---|---|---|
On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging. |
Abstract | ||
|---|---|---|
SRAM-based weak physically unclonable functions (PUFs) have shown promise regarding tamper sensitive key storage and device ID generation. Weak PUFs rely on intrinsic process variations to produce repeatable and unique start-up behavior. However, noise in the system can affect the start-up behavior and introduce errors. A number of solutions, such as fuzzy extraction and error correcting codes hav... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TCSI.2017.2766073 | IEEE Transactions on Circuits and Systems I: Regular Papers |
Keywords | Field | DocType |
Error analysis,Integrated circuit reliability,Aging,Negative bias temperature instability,Thermal variables control,Transistors | Word error rate,Fuzzy logic,Chip,Static random-access memory,Error detection and correction,Electronic engineering,Negative-bias temperature instability,Process variation,Transistor,Mathematics | Journal |
Volume | Issue | ISSN |
65 | 3 | 1549-8328 |
Citations | PageRank | References |
1 | 0.35 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Md. Nazmul Islam | 1 | 4 | 3.15 |
| Vinay C. Patil | 2 | 31 | 4.81 |
| Sandip Kundu | 3 | 1103 | 137.18 |