Name
Abstract | ||
|---|---|---|
Analysis simplified with circuit insights reveals the major sources of distortion in a passive FET-switch-based sampling circuit: 1) $R_{\mathrm{\scriptscriptstyle ON}}$ -modulation; 2) turn-OFF-time instant; and 3) signal-dependent charge-injection. Explicit expressions for second- and third-order distortions advance intuitive understanding of the processes of distortion. Circuit simulations and ... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TCSI.2018.2797987 | IEEE Transactions on Circuits and Systems I: Regular Papers |
Keywords | Field | DocType |
Field effect transistors,Integrated circuit modeling,Switches,Logic gates,Analytical models,Nonlinear distortion | Logic gate,Expression (mathematics),Field-effect transistor,Modulation,Electronic engineering,Sampling (statistics),Sample and hold,Nonlinear distortion,Distortion,Mathematics | Journal |
Volume | Issue | ISSN |
65 | 4 | 1549-8328 |
Citations | PageRank | References |
1 | 0.36 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tetsuya Iizuka | 1 | 92 | 33.22 |
| Takaaki Ito | 2 | 1 | 0.70 |
| Asad A. Abidi | 3 | 1401 | 532.51 |