Name
Title | ||
|---|---|---|
Designing Reliable Processor Cores In Ultimate Cmos And Beyond: A Double Sampling Solution |
Abstract | ||
|---|---|---|
The double sampling paradigm is an efficient method to protect the circuits against soft-errors. But the data that are going out of the area protected by double sampling are still vulnerable. In this paper we proposed an architectural solution that uses three latches to remove those constraints and protect the area outside the double sampling domain without adding a buffer stage. |
Year | Venue | Keywords |
|---|---|---|
2018 | PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) | double sampling, soft-errors, LEON3, reliability |
Field | DocType | ISSN |
Computer science,Parallel computing,CMOS,Double sampling,Computer hardware,Electronic circuit,Multi-core processor | Conference | 1530-1591 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Thierry Bonnoit | 1 | 6 | 2.27 |
| Fraidy Bouesse | 2 | 0 | 0.34 |
| Nacer-Eddine Zergainoh | 3 | 129 | 19.39 |
| Michael Nicolaidis | 4 | 996 | 129.91 |