Name
Abstract | ||
|---|---|---|
Nowadays, the high power density and the process, voltage, and temperature variations became the most critical issues that limit the performance of the digital integrated circuits because of the continuous scaling of the fabrication technology. Dynamic voltage and frequency scaling technique is used to reduce the power consumption while different error recovery techniques are used to tolerate the ... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TCSI.2017.2771821 | IEEE Transactions on Circuits and Systems I: Regular Papers |
Keywords | Field | DocType |
Microarchitecture,Pipelines,Delays,Throughput,Clocks,Safety | Voltage,Power density,Electronic engineering,Frequency scaling,Throughput,Scaling,Mathematics,Microarchitecture,B-MAC,Speedup | Journal |
Volume | Issue | ISSN |
65 | 6 | 1549-8328 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Shady O. Agwa | 1 | 2 | 1.43 |
| Eslam Yahya | 2 | 25 | 5.94 |
| Yehea Ismail | 3 | 199 | 31.36 |