Name
Abstract | ||
|---|---|---|
Resilient systems for future application as the Internet of Things (IoT), aerospace or automotive must satisfy demanding specifications over a 10-years lifespan. Thus, time-dependent degradation must be considered in early design stages. To ensure a realistic estimation of degradation impact a whole matrix decomposition algorithm is implemented in a 65nm CMOS technology with different multi threshold voltage standard cells, for a required low-power design. We present an assessment method based on stochastic mission profiles saving at least 10% area and power compared to common methods. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/DDECS.2018.00007 | 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) |
Keywords | Field | DocType |
CMOS,Aging,BTI,HCI,Multi-Vth | Aerospace,Computer science,Internet of Things,Matrix decomposition,Electronic engineering,CMOS,Threshold voltage,Automotive industry | Conference |
ISBN | Citations | PageRank |
978-1-5386-5755-3 | 0 | 0.34 |
References | Authors | |
6 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Theodor Hillebrand | 1 | 0 | 0.68 |
| Ludwig Karsthof | 2 | 0 | 0.34 |
| Steffen Paul | 3 | 142 | 40.96 |
| Dagmar Peters-Drolshagen | 4 | 39 | 12.87 |