Name
Abstract | ||
|---|---|---|
In nanometer technologies, circuits are more and more sensitive to various kinds of perturbations. Alpha particles and atmospheric neutrons induce single-event upsets, affecting memory cells, latches, and flip-flops. They also induce single-event transients, initiated in the combinational logic and captured by the latches and flip-flops associated with the outputs of this logic. In the past, the m... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TVLSI.2018.2818021 | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Keywords | Field | DocType |
Registers,Clocks,Pipelines,Hardware,Random access memory,Latches,Transient analysis | Soft error,Computer science,Electronic engineering,Error detection and correction,Combinational logic,Implementation,Fault tolerance,Electronic circuit,Rollback,Very-large-scale integration,Embedded system | Journal |
Volume | Issue | ISSN |
26 | 8 | 1063-8210 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Thierry Bonnoit | 1 | 6 | 2.27 |
| Nacer-Eddine Zergainoh | 2 | 129 | 19.39 |
| Michael Nicolaidis | 3 | 996 | 129.91 |