Paper Info
Title
Variation- and degradation-aware stochastic behavioral modeling of analog circuit components
Abstract
Process variation and aging effects influence the performances of integrated circuits in modern technology nodes. In this paper, a method is proposed to build a behavioral model to represent the influences of process variation, aging and operational parameters on circuit performances. The variability of performance is represented using distribution functions while Response Surface Models (RSM) are used to describe the dependence of the distribution's moments on operational parameters. Compared to other approaches, less parameters have to be included in the RSM therefore reducing the complexity. This enables a fast Monte-Carlo analysis with aging analysis on a behavioral level. The method is evaluated for a voltage reference circuit and an operational amplifier showing a good representation of the variability and reaching a very good speedup of simulation time.
Year
DOI
Venue
2017
10.1109/SMACD.2017.7981581
2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
Keywords
Field
DocType
variation-ware stochastic behavioral modeling,analog circuit components,process variation,aging effects,integrated circuits,behavioral model,distribution functions,response surface model,distribution moment,operational parameters,complexity reduction,Monte-Carlo analysis,aging analysis,behavioral level,voltage reference circuit,operational amplifier
Monte Carlo method,Simulation,Computer science,Behavioral modeling,Voltage reference,Electronic engineering,Process variation,Transistor,Integrated circuit,Operational amplifier,Speedup
Conference
ISSN
ISBN
Citations 
2575-4874
978-1-5090-5053-6
3
PageRank 
References 
Authors
0.54
7
4
Name
Order
Citations
PageRank
maike taddiken1174.12
Theodor Hillebrand2113.02
Steffen Paul314240.96
Dagmar Peters-Drolshagen43912.87