Title
Reliability-Aware Voltage Scaling of Multicore Processors in Dark Silicon Era.
Year
Venue
Field
2017
TopHPC
Dark silicon,Computer science,Voltage,Multi-core processor,Electrical engineering,Scaling
DocType
Citations 
PageRank 
Conference
0
0.34
References 
Authors
0
2
Name
Order
Citations
PageRank
Hamid Nejatollahi1225.02
Mostafa E. Salehi211113.74