Name
Title | ||
|---|---|---|
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs. |
Abstract | ||
|---|---|---|
Single-event multiple transients (SEMTs) measurement based on an on-chip self-triggered method is performed. Measurement results for guard-ring hardened inverter chains of two layout designs, including a source/drain sharing design and a conventional design, are compared under pulsed laser irradiation. Pulsed laser exposures with different energies show that the guard-ring hardened inverter chain with a source/drain sharing design is more sensitive to single-event double transients (SEDTs). It is found that SEDTs with small temporal differences can be merged into single-event single transients (SESTs) thanks to the pulse broadening effect. A layout-hardened design for SEDTs in the guard-ring hardened inverter chain is also suggested. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1016/j.microrel.2018.06.014 | Microelectronics Reliability |
Keywords | Field | DocType |
Inverter chain,Layout design,Pulsed laser beam,Single-event multiple transients (SEMTs),Single-event transient (SET) pulse width | Inverter,Irradiation,Electronic engineering,Guard ring,Pulsed laser,Engineering,Pulse broadening,Optoelectronics | Journal |
Volume | ISSN | Citations |
87 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 4 | 11 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Wen Zhao | 1 | 0 | 0.34 |
| Chaohui He | 2 | 8 | 3.65 |
| Wei Chen | 3 | 0 | 0.34 |
| Rongmei Chen | 4 | 0 | 0.34 |
| Peitian Cong | 5 | 0 | 0.34 |
| Fengqi Zhang | 6 | 1 | 1.42 |
| Zujun Wang | 7 | 0 | 0.68 |
| chen shen | 8 | 103 | 17.21 |
| Lisang Zheng | 9 | 1 | 0.75 |
| Xiaoqiang Guo | 10 | 9 | 3.90 |
| Lili Ding | 11 | 0 | 1.35 |