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CHAOHUI HE
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Affiliation
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CHAOHUI HE
Corresponding author. Tel.: +86 29 82665915.
8
Collaborators
Citations
PageRank
34
8
3.65
Referers
Referees
References
33
120
32
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100
120
Publications (8 rows)
Collaborators (34 rows)
Referers (33 rows)
Referees (100 rows)
Title
Citations
PageRank
Year
Single-event multiple transients in guard-ring hardened inverter chains of different layout designs.
0
0.34
2018
FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC.
1
0.36
2018
Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip.
4
0.75
2017
Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor.
0
0.34
2017
Time dependent modeling of single particle displacement damage in silicon devices.
0
0.34
2016
Hot carrier effect on the bipolar transistors' response to electromagnetic interference.
2
0.55
2015
Hot carrier effect on a single SiGe HBT's EMI response
0
0.34
2015
3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment
1
0.63
2015
1