Name
Abstract | ||
|---|---|---|
As a rapid progress in technology processes, the design integration of high-performance system-on-chip (SoC) is on the rise rapidly. To incorporate hundreds of IP cores into a single chip, a modern SoC exceeds ten million gates with a large number of scan cells, so that it leads excessive energy consumption. In this paper, we present an energy-quality (EQ) scalable scan test method using new scan ... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/JETCAS.2018.2833846 | IEEE Journal on Emerging and Selected Topics in Circuits and Systems |
Keywords | Field | DocType |
Energy consumption,Switches,Routing,Reliability,Circuits and systems,Benchmark testing | Test method,Image stitching,Computer science,Parallel computing,Scan chain,Chip,Real-time computing,OpenCores,Energy consumption,Benchmark (computing),Scalability | Journal |
Volume | Issue | ISSN |
8 | 3 | 2156-3357 |
Citations | PageRank | References |
1 | 0.36 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sungyoul Seo | 1 | 10 | 3.27 |
| Keewon Cho | 2 | 18 | 4.64 |
| Young Woo Lee | 3 | 9 | 5.76 |
| Sungho Kang | 4 | 436 | 78.44 |