Name
Abstract | ||
|---|---|---|
Over the last few years, many architectures of body or bulk built-in current sensors (BBICSs) have been proposed to detect transient faults (TFs) in integrated circuits, all of them assessed through simulations in which only single TFs affect the circuit under run-time test. This work assesses and demonstrates the ability of a BBICS architecture in also detecting multiple and simultaneous TFs. Based on the classical double-exponential transient current model, multiple fault effects on a case-study circuit have been simulated with the injection of several current sources approximately representing the Gaussian distribution of a laser beam attack. Results show the BBICS architecture is able to detect multiple TFs simultaneously perturbing sensitive nodes of the case-study circuit. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1016/j.microrel.2018.07.111 | Microelectronics Reliability |
Field | DocType | Volume |
Transient current,Electronic engineering,Gaussian,Engineering,Integrated circuit,Laser beams | Journal | 88 |
ISSN | Citations | PageRank |
0026-2714 | 0 | 0.34 |
References | Authors | |
11 | 7 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Raphael Andreoni Camponogara Viera | 1 | 5 | 2.24 |
| Jean-Max Dutertre | 2 | 313 | 29.14 |
| Marie-Lise Flottes | 3 | 366 | 45.31 |
| Olivier Potin | 4 | 38 | 3.59 |
| Giorgio Di Natale | 5 | 368 | 54.26 |
| Bruno Rouzeyre | 6 | 456 | 49.44 |
| Rodrigo Possamai Bastos | 7 | 80 | 13.80 |