Name
Title | ||
|---|---|---|
Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas. |
Abstract | ||
|---|---|---|
This brief demonstrates a fully contactless wafer-level testing based on UHF radio identification (RFID) technology enriched by high-quality on-chip antenna. The antenna, which uses exactly the same tag IC area (i.e., 0.45 mm2), exploits a low-cost post-process consisting of a thick dielectric layer and a copper metal, thus significantly improving the quality factor with respect to a standard CMOS... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TCSII.2018.2852949 | IEEE Transactions on Circuits and Systems II: Express Briefs |
Keywords | Field | DocType |
Antennas,Testing,Integrated circuits,Radiofrequency identification,Couplings,Silicon,Q-factor | Wafer,Q factor,Coupling,General purpose,Inductive coupling,Electronic engineering,CMOS,Integrated circuit,Ultra high frequency,Electrical engineering,Mathematics | Journal |
Volume | Issue | ISSN |
65 | 10 | 1549-7747 |
Citations | PageRank | References |
1 | 0.36 | 0 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Alessandro Finocchiaro | 1 | 45 | 5.12 |
| G. Girlando | 2 | 7 | 1.86 |
| Alessandro Motta | 3 | 1 | 0.70 |
| A. Pagani | 4 | 3 | 1.80 |
| Egidio Ragonese | 5 | 47 | 12.65 |
| giuseppe palmisano | 6 | 13 | 3.63 |