Author Info
Name
Affiliation
Papers
ALESSANDRO MOTTA
Test Technology Research and Development Department, STMicroelectronics, Agrate Brianza, Italy
2
Collaborators
Citations 
PageRank 
14
1
0.70
Referers 
Referees 
References 
3
0
0
Title
Citations
PageRank
Year
Wafer-Level Contactless Testing Based on UHF RFID Tags With Post-Process On-Chip Antennas.10.362018
An Evolutionary Algorithm Approach To Stress Program Generation During Burn-In00.342018