Name
Abstract | ||
|---|---|---|
In this paper, a design for debug (DFD) method that reuses test resources is proposed to reduce the debug cost in post-silicon validation. With the proposed method, the trace buffer is shared for embedded cores to capture the signatures of each core concurrently by reusing a test access mechanism. In this case, the depth of the trace buffer allocated to the core is reconfigurable and variable acco... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TC.2018.2835462 | IEEE Transactions on Computers |
Keywords | Field | DocType |
Buffer storage,Routing,Debugging,Computer architecture,Runtime | Computer science,Reuse,Parallel computing,Silicon debug,Trace buffer,Embedded system,Debugging | Journal |
Volume | Issue | ISSN |
67 | 12 | 0018-9340 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Inhyuk Choi | 1 | 15 | 4.75 |
| Hyunggoy Oh | 2 | 14 | 4.80 |
| Young Woo Lee | 3 | 9 | 5.76 |
| Sungho Kang | 4 | 12 | 6.64 |