Name
Title | ||
|---|---|---|
OLT(RE): An On-Line On-Demand Testing Approach for Permanent Radiation Effects in Reconfigurable Systems. |
Abstract | ||
|---|---|---|
Reconfigurable systems gained great interest in a wide range of application fields, including aerospace, where electronic devices are exposed to a very harsh working environment. Commercial SRAM-based FPGA devices represent an extremely interesting hardware platform for this kind of systems since they combine low cost with the possibility to utilize state-of-the-art processing power as well as the... |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/TETC.2016.2586195 | IEEE Transactions on Emerging Topics in Computing |
Keywords | DocType | Volume |
Field programmable gate arrays,Circuit faults,Performance evaluation,Radiation effects,Reconfigurable devices,Very large scale integration,Fault tolerant systems,Nanotechnology | Journal | 6 |
Issue | ISSN | Citations |
4 | 2168-6750 | 0 |
PageRank | References | Authors |
0.34 | 0 | 8 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dario Cozzi | 1 | 23 | 2.34 |
| Sebastian Korf | 2 | 15 | 1.77 |
| Luca Cassano | 3 | 62 | 11.36 |
| Jens Hagemeyer | 4 | 74 | 9.47 |
| Andrea Domenici | 5 | 100 | 17.16 |
| Cinzia Bernardeschi | 6 | 226 | 31.87 |
| Luca Sterpone | 7 | 233 | 41.54 |
| Mario Porrmann | 8 | 420 | 50.91 |