Name
Abstract | ||
|---|---|---|
With the rapid development of integrated circuit manufacturing processes, the degree of integration of system-on-chip(SoC) has increased dramatically. In this paper, a dictionary-based test data compression method with tri-state coding is proposed to reduce the increasing test data volume. Firstly the partial input reduction is used to preprocess the test set, and then the tri-state coding is presented to mark the index so that it can encode anywhere in the test set. Experimental results on ISCAS'89 benchmark circuits show that the average compression rate of the proposed scheme reaches 73.92% by increasing the hardware area overhead slightly. |
Year | DOI | Venue |
|---|---|---|
2018 | 10.1109/ATS.2018.00019 | 2018 IEEE 27th Asian Test Symposium (ATS) |
Keywords | Field | DocType |
Dictionary-based compression,Tri-state coding,Test data compression,Partial input reduction | ENCODE,Data compression ratio,Computer science,Integrated circuit manufacturing,Coding (social sciences),Electronic engineering,Test data compression,Test data,Electronic circuit,Computer engineering,Test set | Conference |
ISSN | ISBN | Citations |
1081-7735 | 978-1-5386-9467-1 | 0 |
PageRank | References | Authors |
0.34 | 6 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tian Chen | 1 | 6 | 3.49 |
| Chenxin Lin | 2 | 0 | 0.34 |
| Huaguo Liang | 3 | 216 | 33.27 |
| Fuji Ren | 4 | 803 | 135.33 |